White Papers
- Robust Fundamental Parameter Method XRF
- CdTe, CZT detectors
- SiLi-SDD-HPGe-CdTe
- A robust digital signal processor: Determining the true input rate
- The necessity of recognizing all events in X-ray detection, ICR OCR curves
- A maximum information utilization approach in XRF
- The necessity of maximum information utilization
- Quality assurance_via digital signal processing in nuclear spectroscopy
- The origin of the lineshape
- On the role of the signal processing electronics in X-ray analytical measurements